This X-ray fluorescence analyzer has sub-ppm sensitivity
The ALTRACE is a benchtop energy-dispersive X-ray fluorescence (EDXRF) spectrometer (photo) designed for rapid, non-destructive elemental analysis across a wide range of sample types. Featuring sub-ppm sensitivity, it provides screening for elements from sodium to uranium in solids, liquids and powders without chemical pretreatment. Its key analytical capabilities include sub-ppm sensitivity, extending down to 0.1 ppm for heavy metals, the company says, as well as a wide dynamic range, with direct batch analysis spanning from 0.1 ppm to 100%. ALTRACE uses a high-energy 65 kV X-ray tube, a proprietary high-count-rate detector and an advanced X-ray optical system to deliver precise, multi-element quantification from trace to major concentrations. Its streamlined operation requires minimal sample preparation and consumables, making it a cost-effective, user-friendly solution for routine analysis and quality control. — Shimadzu Corp., Kyoto, Japan