The EDX-7200 energy-dispersive X-ray fluorescence spectrometer (photo) is equipped with a high-resolution silicon drift detector (SDD) to achieve a higher count rate and detection efficiency than its predecessor models. Along with the SDD, the EDX-7200 incorporates a high-speed circuit that achieves highly precise analysis of the target element in a shorter measurement time. It increases the count rate by up to 30 times compared to the former model (EDX-720). Improved algorithms and performance also help to reduce measurement times. In addition, the EDX-7200 delivers high-sensitivity performance, improving the lower detection limit of trace elements in metal by up to six times that of the previous model. With the SDD, the EDX-7200 offers superior energy resolution compared to earlier models. This reduces the effects of overlapping peaks of different elements, enhancing the reliability of the analysis results. This flexible instrument accommodates all types of samples — from small to large, from solids to powders to liquids. Options include a vacuum measurement unit, helium purge unit (for highly sensitive measurement of light elements), and a 12-sample turret for automated continuous measurements. The new automatic measurement time-reduction function automatically switches to the next analysis channel if a controlled substance clearly has a high or low concentration, making evaluation possible while measurement is underway. This achieves more efficient screening analysis. — Shimadzu Scientific Instruments, Columbia, Md.