This new XRD system is compact, but powerful
In late February, this company launched a new version of its Aeris compact X-ray diffractometer (XRD; photo). Aeris is a small-footprint system that contains capabilities previously only seen in much larger systems. Building on the family of compact Aeris XRD systems that provide high-quality data from polycrystalline materials at competitive speeds, the new Aeris model is designed for use in all environments. Specifically, grazing-incidence XRD enables the examination of thin films and coatings, while transmission measurements provides more accurate data that are not affected by sample-preparation artefacts. The Aeris XRD’s straightforward operational interface simplifies XRD measurements for the user. The performance of the Aeris is similar to floor-standing systems, and it does not require any external supplies and infrastructure. The Aeris can also be used in a regulated environment with OmniTrust software. — Malvern Panalytical B.V., Almelo, the Netherlands